SS 2019 WS 2018
SS 2018
SS 2017 WS 2017
Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 16.04  2nd HS: 04.06  sem.br.: 23.07  begin WS: 13.10

4020180196 Practical Course in Electron Microscopy - Basics and Application  VVZ 

PR
Mon 15-19
weekly NEW 15 0'516 (0) Holm Kirmse
Aims
In completion to the lecture on Electron microscopy 40537 the TEM techniques are applied in a hands-on course. Two TEM machines are available. The TEM/STEM Hitachi H-8110 is utilized for conventional techniques. The TEM/STEM JEOL JEM2200FS is used for spectroscopy-based methods.
Requirements
Attendance of the Lecture on Electron microscopy 40537
Assigned modules
P25.2.c P35.4
Amount, credit points; Exam / major course assessment
4 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Contact
Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
Literature
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9
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