4020210189 Hands-on Course in Electron Microscopy - Basics and Application
Digital- & Präsenz-basierter Kurs
- classroom language
- DE
- aims
- In completion to the lecture on Electron Microscopy the TEM techniques introduced there are applied in this hands-on course. The students will be trained to align the microscope first. Subsequently, TEM/STEM techniques introduced in the lecture are performed. The techniques comprise electron diffraction, amplitude and phase contrast imaging, and scanning TEM bright and dark field imaging as well as spectroscopical methods. The course is performed at the TEM/STEM JEOL JEM2200FS.
- requirements
- Attendance of the Lecture on Electron microscopy 4020210178
- assigned modules
-
P24.2.e
P25.2.c
P35.4
- amount, credit points; Exam / major course assessment
- 4 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
- contact
- Dr. Holm Kirmse, NEW15, R. 3'308, Tel. 7641
- literature
-
D.B. Williams, C.B. Carter. Transmission electron microscopy. Plenum Press, New York 1996; ISBN 0-306-45324-X
B. Fultz, J.M. Howe. Transmission electron microscopy and diffractometry of materials. 2nd edition, Springer 2002; ISBN3-540-43764-9