4020220083 Physics of solar cells and their analysis by electron microscopy
Digital- & Präsenz-basierter Kurs
- classroom language
- DE
- requirements
- Basics of semiconductor physics
- structure / topics / contents
- Basics of semiconductor physics, generation and recombination of charge carriers, diffusion and drift currents, p-n junctions, tandem devices, current-voltage characteristics, detailed balance / Shockley-Queisser limit, quantum efficiency, electroluminescence, capacitance spectroscopy, basics of device simulations; scanning and transmission electron microscopy methods with specific application on solar cells: imaging, diffraction, energy-dispersive and wavelength-dispersive X-ray spectroscopy, electron energy-loss spectroscopy, electron holography, cathodoluminescence, electron-beam-induced current measurements.
- assigned modules
-
P24.2.e
- amount, credit points; Exam / major course assessment
- 2 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
- other
- Einschreibeschlüssel: PV-HU
Literatur:
P. Würfel, Physik der Solarzellen, Springer
D. Abou-Ras, T. Kirchartz, U. Rau (eds.), Advanced Characterization Techniques for Thin-Film Solar Cells, Wiley
- contact
- PD Dr. Daniel Abou-Ras, abourasd@hu-berlin.de
- literature
-
P. Würfel. Physik der Solarzellen. Springer
D. Abou-Ras, T. Kirchartz, U. Rau . Advanced Characterization Techniques for Thin-Film Solar Cells. Wiley
. .
- quod vide:
- http://www.physik.hu-berlin.de/en/sem/teaching