SS 2020 WS 2019
SS 2019
SS 2018 WS 2018
Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 08.04  2nd HS: 27.05 15.07  begin WS: 14.10

4020190133 Introduction to Electron Microscopy      VVZ  

Wed 13-15
weekly NEW 14 2'05 (0) Walid Hetaba


classroom language
This course concerns the operation of modern electron microscopes as well as the techniques used in analytical electron microscopy. Various imaging and analytical methods for structural characterisation and investigation of the electronic properties of different material classes are dealt with.
By learning about the advantages, disadvantages and requirements of each method, the students are enabled to decide which methods in electron microscopy are the most suitable to address the respective scientific question.
Basic knowledge of quantum mechanics and diffraction theory,
Basic knowledge of solid state physics and electrodynamics
structure / topics / contents
Electron optics
Electron-matter interaction
Scanning electron microscopy
Transmission electron microscopy
Simulation techniques
assigned modules
P24.2.e P35.4
amount, credit points; Exam / major course assessment
2 SWS, 5 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
Participation in the "Practical Course in Electron Microscopy - Basics and Application"
Oral examination possible.
The course is accompanied by the "Practical Course in Electron Microscopy - Basics and Application" (40540).
This lecture will be held in English.
Dr. Walid Hetaba, FHI-Berlin, Faradayweg 4-6, 14195 Berlin, Tel.: 030/8413-4412,
D.B. Williams, C.B. Carter. Transmission Electron Microscopy. Springer New York 2009, ISBN 978-0-387-76500-6
B. Fultz, J. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin 2013, ISBN 978-3-642-29760-1
L. Reimer, H. Kohl. Transmission Electron Microscopy. Springer New York 2008, ISBN 978-0-387-40093-8
R.F. Egerton. Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer New York 2011, ISBN 978-1-4419-9582-7
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