Faculty of Mathematics and Natural Sciences Department of Physics auf deutsch


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summer sem. 2023
Last update: 06.11.24 14:22:09



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SS 2024 WS 2023
SS 2023
SS 2022 WS 2022
Department of Physics
open chemistry
KVL / Klausuren / MAP 1st HS: 17.04  2nd HS: 05.06  sem.br.: 24.07  begin WS: 15.10

4020230081 X-Ray Scattering: Basics and Applications in Materials Science      VVZ  

VL
Thu 9-11
weekly nV or digital (0) Martin Schmidbauer
UE
Wed 13-15
14-day nV or digital (0) Martin Schmidbauer

Digital- & Präsenz-basierter Kurs

classroom language
EN
aims
The Lecture is intended to give an introduction into practics and theory of x-ray diffraction.

At the end of the semester I offer practical lessons (1-2 days) at the Leibniz-Institute for Crystal Growth where different experimental techniques will be applied.
requirements
Knowledge in atomic and solid state physics
structure / topics / contents
1. Introduction, History, X-ray sources
2. Kinematical X-Ray Scattering Theory
3. Crystal structure determination
4.Phase Analysis, Powder Diffractometry
5.Dynamical Diffraction Theory
6.X-Ray Topography
7. High-Resolution X-Ray Diffraction
8. X-Ray Reflectometry
9. Diffuse Scattering from Interfacial Roughness
10.X-Ray Small Angle Scattering
11.Diffuse Scattering from Phonons and Point Defects
12.Spectroskopical Techniques

assigned modules
P25.2.c P35.4
amount, credit points; Exam / major course assessment
3 SWS, 6 SP/ECTS (Arbeitsanteil im Modul für diese Lehrveranstaltung, nicht verbindlich)
yes
other
On demand the lectures will be given in english language. Leibniz-Institut für Kristallzüchtung, Max-Born-Str.2, 12489 Berlin, Raum 19.30 414
contact
Dr. Martin Schmidbauer; martin.schmidbauer@ikz-berlin.de; 030-6392-3097
literature
Jens Als-Nielsen, Des McMorrow. Elements of Modern X-Ray Physics . Wiley-VCH, 1. Auflage 2001, ISBN 0-471-49858-0
U. Pietsch, V. Holy, und T. Baumbach. High-Resolution X-Ray Scattering from Thin Films and Lateral Nanostructures. Springer, Berlin, Heidelberg, 2004
L. Spieß et al. Moderne Röntgenbeugung. Teubner, 1. Auflage 2005, ISBN 3-519-00522-0
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